The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Jun. 19, 2006
Applicants:

Jiali Zhao, Beijing, CN;

Seokcheol Kee, Seoul, KR;

Haitao Wang, Seoul, KR;

Haibing Ren, Seoul, KR;

Wonjun Hwang, Seoul, KR;

Inventors:

Jiali Zhao, Beijing, CN;

Seokcheol Kee, Seoul, KR;

Haitao Wang, Seoul, KR;

Haibing Ren, Seoul, KR;

Wonjun Hwang, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A image verification method, medium, and apparatus using a local binary pattern (LBP) discriminant technique. The verification method includes generating a kernel fisher discriminant analysis (KFDA) basis vector by using the LBP feature of an input image, obtaining a Chi square inner product by using the LBP feature of an image registered in advance and a kernel LBP feature and projecting to a KFDA basis vector, obtaining a Chi square inner product by using the LBP feature of a query image and a kernel LBP feature and projecting to a KFDA basis vector, and obtaining the similarity degree of the target image and the query image that are obtained as Chi square inner product results, and projected to the KFDA basis vector. According to the method, medium, and apparatus, the KFDA based LBP shows superior performance over conventional LBP, KFDA, and biometric experimentation environment (BEE) baseline algorithms.


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