The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Aug. 28, 2007
Harald U. Mueller, Fulda, DE;
Paul Szasz, Plankstadt, DE;
Ralf Huck, Grosskrotzenburg, DE;
Tilo Merlin, Linsengericht, DE;
Steffen Keller, Constance, DE;
Harald U. Mueller, Fulda, DE;
Paul Szasz, Plankstadt, DE;
Ralf Huck, Grosskrotzenburg, DE;
Tilo Merlin, Linsengericht, DE;
Steffen Keller, Constance, DE;
ABB AG, Mannheim, DE;
Abstract
A method is disclosed for determining a characteristic of a sensor arrangement having at least one measuring sensor and at least one reference sensor for recording the same physical variable, and having an analysis unit electrically connected thereto. The characteristic is determined from measured values of the at least one measuring sensor and of the at least one reference sensor. It is proposed to record a characteristic point during continuous measurement operation, starting with the first time the sensor arrangement is put into operation, when a definable measurement point is reached in a process for the first time, if the changes in measured value in the variation over time of the at least one measuring sensor and in the variation over time of the at least one reference sensor remain within a definable tolerance band within a definable time interval.