The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Apr. 27, 2007
Derek P. Bagwell, Rochester, MN (US);
Gary V. Tollers, Rochester, MN (US);
Cheranellore Vasudevan, Austin, TX (US);
Derek P. Bagwell, Rochester, MN (US);
Gary V. Tollers, Rochester, MN (US);
Cheranellore Vasudevan, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus, and product are disclosed for optimizing manufacturing testing of a customized configuration of a product. A plurality of part objects are defined within an order configuration application. Each one of the part objects is associated with one of a plurality of parts. A plurality of test objects is defined within the order configuration application. Each one of the test objects is associated with one of a plurality of tests. The order configuration application is used to generate order information using the part objects that are associated with parts that are selected to be included in a customized product. The order configuration application is also used to generate test cases using the test objects that are associated with the part objects that are associated with parts that are selected to be included in a customized product.