The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Jun. 29, 2007
Applicants:

Michael P. Weir, Blanchester, OH (US);

John R. Lewis, Bellevue, WA (US);

Amjad I. Malik, Bothell, WA (US);

Christopher A. Wiklof, Everett, WA (US);

Mathew D. Watson, Bellevue, WA (US);

Richard A. James, Woodinville, WA (US);

Inventors:

Michael P. Weir, Blanchester, OH (US);

John R. Lewis, Bellevue, WA (US);

Amjad I. Malik, Bothell, WA (US);

Christopher A. Wiklof, Everett, WA (US);

Mathew D. Watson, Bellevue, WA (US);

Richard A. James, Woodinville, WA (US);

Assignees:

Ethicon Endo-Surgery, Inc, Cincinnati, OH (US);

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning beam assembly includes a beam generator to generate a beam of radiation; at least one reflector configured to deflect the beam across a field of view; and a plurality of multi-mode optical fibers for receiving radiation reflected from the field of view, wherein the optical fibers have end surfaces that face in at least two different directions, or wherein the optical fibers are configured to receive scattered radiation from an angular field of view larger than that determined by their individual numerical apertures.


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