The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7558429 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 07, 2009

Filed:

Aug. 16, 2005
Applicants:

Chien-yu Lin, Taipei County, TW;

Tzu-hsin Wang, Hsinchu, TW;

Pai-chu Hsieh, Taipei, TW;

Inventors:

Chien-Yu Lin, Taipei County, TW;

Tzu-Hsin Wang, Hsinchu, TW;

Pai-Chu Hsieh, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing method and a method for detecting differences between different image macro-blocks are provided. The image processing method includes steps of: providing one of a plurality of macro-blocks of a processed image; performing a method for detecting the differences between the macro-blocks of different images, and there should be at least two images before the processed image in displaying time sequence for obtaining a macro-block difference table; and in the process of image encoding, if the processed image is a P-picture, determining whether the macro-block is a skip mode or not, by reference to the macro-block table in an auxiliary manner.


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Lin, Chien-Yu. (2009). Image processing method and method for detecting differences between different image macro-blocks (U.S. Patent No. 7558429). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7558429

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