The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Jul. 20, 2005
Applicants:

Volker Schmidt, Erlangen, DE;

Hans Schüll, Weisendorf, DE;

Werner Striebel, Schwarzenbruck, DE;

Inventors:

Volker Schmidt, Erlangen, DE;

Hans Schüll, Weisendorf, DE;

Werner Striebel, Schwarzenbruck, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for analyzing image processing procedures, in which unprocessed original image data is stored, stored original image data is retrieved, retrieved original image data is processed, the individual processing steps during the processing of the image data are in some instances stored together with the respective processing step parameter values, and the processed image data is stored such that it can be assigned to the processing steps stored during its processing and in some instances processing step parameter values. According to the invention the processed image data is analyzed statistically and the result of the statistical analysis is stored such that it can be assigned to the stored processing steps and in some instances processing step parameter values. The original image data is optionally included in the statistical analysis of the processed image data.


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