The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Feb. 06, 2004
Paul Richard Granfors, Sunnyvale, CA (US);
Manat Maolinbay, Gilroy, CA (US);
Richard Aufrichtig, Mountain View, CA (US);
Paul Richard Granfors, Sunnyvale, CA (US);
Manat Maolinbay, Gilroy, CA (US);
Richard Aufrichtig, Mountain View, CA (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and system for detecting the potential of an x-ray imaging system to create images with scintillator hysteresis artifacts includes examining an x-ray image to measure two signal levels for two areas of interest, then determining a difference between the two signal levels and comparing the difference to a threshold. The signal levels can be measured by determining an amount of electrical charge discharged in photodiodes of the detector. If the difference in signals is greater than the threshold amount, then the possibility exists that scintillator hysteresis artifacts may be produced in images. In addition, the present invention also provides for the elimination or reduction in magnitude of scintillator hysteresis artifacts in images produced by an x-ray imaging system. After the possibility of scintillator hysteresis artifacts is detected, the detector can be irradiated with an x-ray flux to eliminate or reduce the magnitude of the artifacts in images produced by the x-ray imaging system.