The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Aug. 01, 2003
Michael Elashoff, Germantown, MD (US);
Chris Alvares, Potomac, MD (US);
Peter Lauren, Columbia, MD (US);
Michael Elashoff, Germantown, MD (US);
Chris Alvares, Potomac, MD (US);
Peter Lauren, Columbia, MD (US);
Ocimum Biosolutions, Inc., Gaithersburg, MD (US);
Abstract
An automated system and method are provided for analyzing gene expression data obtained from a plurality of microarrays having mismatch (MM) probe pairs and perfect match (PM) probe pairs. Image data for a plurality of scanned microarrays is stored in a database along with a set of microarray parameters which includes one or more image processing metrics for quality control of the microarray and a pass/fail status of the microarray as determined by these metrics. The user can search the database records according to one or more microarray parameters. The image processing metrics include algorithms for removing local background effects from the probe measurements by determining a model for estimated background using PM probe values. Other image processing metrics utilize a modified Robust Multi-array Averaging (RMA) applied to PM probes to assign weights to probes for determining overall quality of a microarray.