The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Oct. 01, 2008
Yuichi Tomioka, Utsunomiya, JP;
Takeshi Yamawaki, Tokyo, JP;
Yuichi Tomioka, Utsunomiya, JP;
Takeshi Yamawaki, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A compact optical scanning apparatus capable of desirably correcting an f characteristic, a field curvature, and other aberrations, and an image forming apparatus using the same, which includes an incident optical system (LA) for guiding a beam from a light source () to a deflector () and an imaging optical system (LB) for guiding the beam to a scanning surface (), wherein a scanning field angle region whereandare satisfied exists within effective scanning field angle region, where in a main scanning cross section and for a scanning field anglerepresents an angle between a principal ray of beam incident on an optical element included in the imaging optical system and located closest to the scanning surface and an optical axis of the imaging optical system andan angle between a principal ray of a beam from the optical element and the optical axis.