The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Dec. 19, 2006
Applicants:
David Hertz, Dix Hills, NY (US);
Mark E. Hamberger, Bayshore, NY (US);
Terry Morrone, Melville, NY (US);
Inventors:
David Hertz, Dix Hills, NY (US);
Mark E. Hamberger, Bayshore, NY (US);
Terry Morrone, Melville, NY (US);
Assignee:
Fonar Corporation, Melville, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
According to a method of detecting and compensating for MRI scan errors, MRI scan data are received. At least one statistical boundaries is determined for the generated data. The data are observed in K-space. The observed K-space data are compared to the determined statistical boundary. Data that are likely undesirable, based on the comparison, are removed. The removed data are replaced with substitute data to modify the data set. Images are generated from the modified data set.