The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7557570 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 07, 2009

Filed:

Nov. 03, 2006
Applicants:

Alfred E. Crouch, San Antonio, TX (US);

Todd Goyen, San Antonio, TX (US);

Patrick C. Porter, Houston, TX (US);

Shawn Laughlin, The Woodlands, TX (US);

Inventors:

Alfred E. Crouch, San Antonio, TX (US);

Todd Goyen, San Antonio, TX (US);

Patrick C. Porter, Houston, TX (US);

Shawn Laughlin, The Woodlands, TX (US);

Assignee:

The Clock Spring Company L.P., Houston, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/82 (2006.01); G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.


Find Patent Forward Citations

Crouch, Alfred. (2009). System and method for producing color contour maps of surface defects of high pressure pipelines (U.S. Patent No. 7557570). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7557570

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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