The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Nov. 03, 2006
Alfred E. Crouch, San Antonio, TX (US);
Todd Goyen, San Antonio, TX (US);
Patrick C. Porter, Houston, TX (US);
Shawn Laughlin, The Woodlands, TX (US);
Alfred E. Crouch, San Antonio, TX (US);
Todd Goyen, San Antonio, TX (US);
Patrick C. Porter, Houston, TX (US);
Shawn Laughlin, The Woodlands, TX (US);
The Clock Spring Company L.P., Houston, TX (US);
Abstract
A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.