The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2009
Filed:
Mar. 28, 2007
Jae-gyun Shim, Suwon, KR;
Yun-sung NA, Cheunan, KR;
In-gu Jeon, Suwon, KR;
Tae-hung Ku, Suwon, KR;
Jae-sung Park, Yonin, KR;
Su-myung Lee, Yongin, KR;
Jae-Gyun Shim, Suwon, KR;
Yun-Sung Na, Cheunan, KR;
In-Gu Jeon, Suwon, KR;
Tae-Hung Ku, Suwon, KR;
Jae-Sung Park, Yonin, KR;
Su-Myung Lee, Yongin, KR;
TechWing Co., Ltd., Hwaseung, Gyeonggi-do, KR;
Abstract
A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.