The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Oct. 01, 2007
Applicants:

Di Qu, Ada, MI (US);

Gurinder Paul S. Seehra, Grand Rapids, MI (US);

Christopher J. Masotti, East Grand Rapids, MI (US);

Inventors:

Di Qu, Ada, MI (US);

Gurinder Paul S. Seehra, Grand Rapids, MI (US);

Christopher J. Masotti, East Grand Rapids, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); G01L 1/00 (2006.01); G01N 3/08 (2006.01); A61B 5/117 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to methods of measuring the overall elasticity of skin and determining the portion of the overall elasticity that is due to elastic properties and the portion of overall elasticity that is due to viscoelastic properties of the skin and correlating the results of the measurement to an individual's chronological age. The invention also relates to methods of measuring improvements in a person's skin health by measuring elasticity before, during and after human clinical trials of topical and/or oral treatment compositions. The parameters for determining elasticity are based on areas that are defined on a deformation/relaxation curve and require that an inflection point be determined for each skin sample analyzed.


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