The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2009

Filed:

Jul. 18, 2007
Applicants:

Jui Jing Lim, Singapore, SG;

Kok Tong Soh, Singapore, SG;

Hee Ching Ho, Singapore, SG;

Ying Su, Singapore, SG;

Inventors:

Jui Jing Lim, Singapore, SG;

Kok Tong Soh, Singapore, SG;

Hee Ching Ho, Singapore, SG;

Ying Su, Singapore, SG;

Assignee:

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus and method are disclosed. The test apparatus disclosed includes an accelerator assembly and holder assembly that releasably holds a test specimen for acceleration along an acceleration path. Following acceleration along the acceleration path, the test specimen is released from the holder assembly and drops to a landing. The landing can be formed of different materials and at different orientations depending upon the test specifications. Following impact with the landing, the shock robustness of the test specimen is determined to generate shock robustness data. In embodiments disclosed, shock data is used to design shock absorber components for the test specimen or product.


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