The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Oct. 06, 2006
Applicants:

Harsha Badarinarayan, Novi, MI (US);

Frank Hunt, West Bloomfield, MI (US);

Kazutaka Okamoto, Novi, MI (US);

Inventors:

Harsha Badarinarayan, Novi, MI (US);

Frank Hunt, West Bloomfield, MI (US);

Kazutaka Okamoto, Novi, MI (US);

Assignee:

Hitachi, Ltd, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for correcting surface and near surface defects in metal components in which the component is first inspected to identify both the site and size of a component defect. Thereafter, it is determined if the defect is correctable by friction stir processing and, if so, the defect is corrected by performing friction stir processing on the component at the site of the defect. Optionally, one of several different sized friction stir processing tools is selected as a function of the size of the defect.


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