The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Dec. 23, 2004
Christophe J Dorrer, Matawan, NJ (US);
Christophe J Dorrer, Matawan, NJ (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
A method and apparatus for polarization-independent RF spectrum analysis of an optical source, the apparatus including a coupler for coupling the light from an optical source under test with light from a continuous-wave (CW) laser. A nonlinear apparatus is coupled to the coupler for modulating the electric field of the light from the CW laser using the temporal intensity of the light from the source under test to generate a modulated signal. The nonlinear apparatus is adapted to mitigate or compensate for any phase difference between polarization components of signals propagated through the nonlinear apparatus. A polarizer is coupled to the nonlinear apparatus for generating a linearly polarized signal from the modulated signal. An optical spectrum analyzer is coupled to the polarizer for measuring the optical spectrum of the linearly polarized signal to determine an RF spectrum of the optical source under test.