The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Aug. 07, 2007
Applicants:

Peter J. Rothschild, Boston, MA (US);

Jeffrey R. Schubert, Somerville, MA (US);

Aaron D. Pailes, Acton, MA (US);

Inventors:

Peter J. Rothschild, Boston, MA (US);

Jeffrey R. Schubert, Somerville, MA (US);

Aaron D. Pailes, Acton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam, with both beams active simultaneously. Cross-talk between the beams is mitigated by a combination of shielding, scatter detector design, positioning and orientation, and image processing. Image processing subtracts the measured radiation scattered from the transmission beam into the scatter detectors, reducing cross-talk.


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