The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Jun. 13, 2005
Applicant:
Hiroyuki Urushiya, Saitama, JP;
Inventor:
Hiroyuki Urushiya, Saitama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Time-series data over the range of a projection angle is created from a sinogram. Then, time-series data made up of opposite data corresponding to the time-series data over the range of a projection angle is created. Based on the amount of the error between the two types of time-series data, the amount of position deviation of a revolution axis is calculated.
Urushiya, Hiroyuki. (2009). X-ray ct apparatus and image-taking method therefor (U.S. Patent No. 7555096). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7555096
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