The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Jul. 08, 2005
Applicants:

Bengt Lindoff, Bjärred, SE;

Mikael Zirén, Malmö, SE;

Jonas Ohlsson, Malmö, SE;

Johan Nilsson, Höllviken, SE;

Inventors:

Bengt Lindoff, Bjärred, SE;

Mikael Zirén, Malmö, SE;

Jonas Ohlsson, Malmö, SE;

Johan Nilsson, Höllviken, SE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 1/04 (2006.01); H03D 1/06 (2006.01); H03K 6/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for estimating interference level in a receiver are dominated by the receiver's residual frequency error when the interference is low. The interference estimation method can be changed when the interference is low such that it compensates for the effects of residual frequency errors. A method of estimating an interference level includes the steps of detecting an interference level of the received signal; determining whether the detected interference level is low; and if the detected interference level is low, estimating the interference level by at least one of estimating in only a radial direction and de-rotating the received signal before estimating the interference level.


Find Patent Forward Citations

Lindoff, Bengt. (2009). Interference estimation in the presence of frequency errors (U.S. Patent No. 7555074). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7555074

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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