The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
May. 01, 2006
Applicants:
Heinrich Ulrich, Heidelberg, DE;
Werner Knebel, Kronau, DE;
Kyra Moellmann, Trippstadt, DE;
Peter Euteneuer, Lahnau, DE;
Inventors:
Heinrich Ulrich, Heidelberg, DE;
Werner Knebel, Kronau, DE;
Kyra Moellmann, Trippstadt, DE;
Peter Euteneuer, Lahnau, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope comprises an objective and a light source that produces an illumination light beam—in particular for evanescent illumination of a sample, which exhibits a focus in the plane of the objective pupil. To adjust the penetration depth, an adjustment mechanism is provided with which the spatial position of the focus within the plane of the objective pupil may be changed.