The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Jun. 06, 2003
Ernst H. K. Stelzer, Meckesheim, DE;
Sebastian Enders, Heidelberg, DE;
Jan Huisken, Heidelberg, DE;
Steffen Lindek, Plankstadt, DE;
James H. Swoger, Heidelberg, DE;
Ernst H. K. Stelzer, Meckesheim, DE;
Sebastian Enders, Heidelberg, DE;
Jan Huisken, Heidelberg, DE;
Steffen Lindek, Plankstadt, DE;
James H. Swoger, Heidelberg, DE;
Europaeisches Laboratorium fuer Molekularbiologie (EMBL), Heidelberg, DE;
Abstract
The invention relates to a microscope, in which a layer of the sample is illuminated by a thin strip of light () and the sample is viewed () perpendicular to the plane of the strip of light. The depth of the strip of light () thus essentially determines the depth of focus of the system. To record the image, the object () is displaced through the strip of light (), which remains fixed in relation to the detector (), and fluorescent and/or diffused light is captured by a planar detector. Objects () that absorb or diffuse a large amount of light are viewed from several spatial directions. The three-dimensional images, which are captured from each direction can be combined retrospectively to form one image, in which the data is weighted according to its resolution. The resolution of the combined image is then dominated by the lateral resolution of the individual images.