The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Jan. 08, 2008
Kazuhiro Hasegawa, Hachioji, JP;
Kazuhiro Hasegawa, Hachioji, JP;
Olympus Corporation, Tokyo, JP;
Abstract
Provided is a microscope lens barrel including a collecting lens and a deflecting optical system. The collecting lens emits observation light toward the deflecting optical system. The deflecting optical system includes a first reflecting plane, a second reflecting plane, a third reflecting plane, and a fourth reflecting plane, and deflects the observation light emitted from the collecting lens. The first reflecting plane transmits the observation light incident from one direction and reflects the observation light incident at an angle from another direction. The second reflecting plane reflects the observation light transmitted through the first reflecting plane and makes the reflected observation light incident on the first reflecting plane at an angle. The third reflecting plane reflects the observation light reflected by the first reflecting plane in a direction of the second reflecting plane. The fourth reflecting plane reflects the observation light reflected by the third reflecting plane in a direction perpendicular or substantially perpendicular to an optical axis of the collecting lens in a direction from the optical axis of the collecting lens toward the third reflecting plane.