The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Mar. 10, 2006
Applicants:

Gerhard Moeller, Göttingen, DE;

Peter Reimer, Ellwangen, DE;

Peter Andrews, Oberkochen, DE;

Inventors:

Gerhard Moeller, Göttingen, DE;

Peter Reimer, Ellwangen, DE;

Peter Andrews, Oberkochen, DE;

Assignee:

Carl Zeiss Surgical GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A microscope arrangement () is for viewing an object or an intermediate image, which is generated by an object, especially in microsurgery. The microscope arrangement () includes an objective arrangement () having an object plane () for arranging the object or intermediate image () to be viewed. The microscope arrangement has a focus offset adjusting unit () which outputs a focusing offset signal in order to defocus in a defined manner the objective arrangement relative to a focusing state.


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