The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Jul. 30, 2007
Applicants:
Ralf Wolleschensky, Jena, DE;
Wolfgang Bathe, Jena, DE;
Joerg Steinert, Jena, DE;
Dieter Huhse, Berlin, DE;
Inventors:
Ralf Wolleschensky, Jena, DE;
Wolfgang Bathe, Jena, DE;
Joerg Steinert, Jena, DE;
Dieter Huhse, Berlin, DE;
Assignee:
Carl Zeiss Microimaging GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract
Laser Scanning Microscope with an illumination beam path for illumination of a sample and a detection beam path for wavelength-dependent recording of the light from the sample, whereby filters for selection of the detection wavelengths are provided, characterized in that at least one graduated filter spatially variable in regard to the threshold wavelength between the transmission and reflection is provided in several partial beam paths for the selection of the wavelengths.