The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Dec. 15, 2005
Kunihiro Tashiro, Kawasaki, JP;
Yasutoshi Tasaka, Kawasaki, JP;
Hidefumi Yoshida, Kawasaki, JP;
Yoshinori Tanaka, Tottori, JP;
Seiji Doi, Kameyama, JP;
Tomoshige Oda, Kawasaki, JP;
Manabu Sawasaki, Kawasaki, JP;
Tomonori Tanose, Tottori, JP;
Takashi Takagi, Kawasaki, JP;
Isao Tsushima, Yonago, JP;
Tetsuya Fujikawa, Tottori, JP;
Norio Sugiura, Iwata, JP;
Kunihiro Tashiro, Kawasaki, JP;
Yasutoshi Tasaka, Kawasaki, JP;
Hidefumi Yoshida, Kawasaki, JP;
Yoshinori Tanaka, Tottori, JP;
Seiji Doi, Kameyama, JP;
Tomoshige Oda, Kawasaki, JP;
Manabu Sawasaki, Kawasaki, JP;
Tomonori Tanose, Tottori, JP;
Takashi Takagi, Kawasaki, JP;
Isao Tsushima, Yonago, JP;
Tetsuya Fujikawa, Tottori, JP;
Norio Sugiura, Iwata, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
By circular or polygonal openings formed in at least one of a metal film, a semiconductor film, an insulating film and the like, which films are below a reflecting electrode, minute irregularities are densely formed on a surface of the reflecting electrode. In this case, it is required that a linear density defined by peripheral dimensions of the openings per unit area is equal to 0.2 or more.