The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Apr. 13, 2007
Franklin C. Crow, Portola Valley, CA (US);
Douglas A. Voorhies, Menlo Park, CA (US);
John M. Danskin, Cranston, RI (US);
Franklin C. Crow, Portola Valley, CA (US);
Douglas A. Voorhies, Menlo Park, CA (US);
John M. Danskin, Cranston, RI (US);
NVIDIA Corporation, Santa Clara, CA (US);
Abstract
Stippled lines are drawn by evaluating a distance function for a set of points within the area of a stippled line. The distance function gives a distance value proportional to the distance from a point to the end of the stippled line. Using the point's distance value, a pattern index value defines a correspondence between a point and at least one stipple pattern bit. The value of pattern bits are applied to the points on the stippled line, masking the points such that only a portion of the set of points are displayed or determining intensity values according to the position of the points within the stipple pattern. A distance function may be an edge equation associated with the line end or a segment of a polyline. The distance function can be evaluated for the set of points in any order, allowing portions of a stippled line to be drawn in parallel.