The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Dec. 01, 2006
Nathaniel T. Horton, Burien, WA (US);
Dennis M. Lewis, Lynnwood, WA (US);
Nathaniel T. Horton, Burien, WA (US);
Dennis M. Lewis, Lynnwood, WA (US);
The Boeing Company, Chiacgo, IL (US);
Abstract
The 'discrete frequency stir' (DFS) method provides improved mode stir testing of electromagnetic characteristics of an enclosure/cavity. Adequate sampling of the electric field inside the enclosure/cavity is provided by electronic perturbation or 'stirring' of the field with a short duration, continuous wave, radiated source where the wave frequency is stepped in small steps across a frequency range of interest. The frequency steps are selected to be at least slightly larger than the resonant mode bandwidth associated with the given enclosure/cavity in order to provide statistically independent measurements. A stirring bandwidth is selected to encompass a statistically significant number of these measurement samples while maintaining adequate frequency resolution. A statistical evaluation of the measured field is then performed over this stirring bandwidth. For example, the average field level at a given frequency is determined by averaging over the samples contained within the stirring bandwidth when centered on that frequency.