The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Oct. 12, 2007
Andrew Dewdney, Neunkirchen am Brand, DE;
Sabrina Harter, Erlangen, DE;
Andrew Dewdney, Neunkirchen am Brand, DE;
Sabrina Harter, Erlangen, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method for determination and evaluation of a shim parameter set for controlling a shim device in a magnetic resonance (MR) apparatus, the shim device is set using a first shim parameter set, a first field distribution is measured in a body region encompassing a target volume from which MR data are to be acquired, a second shim parameter set is determined using an algorithm for optimization of the field homogeneity in the target volume on the basis of the first shim parameter set and dependent on the first field distribution, a second field distribution is determined on the basis of the second shim parameter set, and the shim parameter sets are evaluated by indirect or direct comparison of the first field distribution and the second field distribution, in particular in the target volume.