The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Dec. 14, 2005
Applicants:

Shunichi Wakamatsu, Sayama, JP;

Tsuyoshi Shiobara, Sayama, JP;

Tsukasa Kobata, Sayama, JP;

Naoki Onishi, Sayama, JP;

Inventors:

Shunichi Wakamatsu, Sayama, JP;

Tsuyoshi Shiobara, Sayama, JP;

Tsukasa Kobata, Sayama, JP;

Naoki Onishi, Sayama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 41/053 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the present invention is to perform measuring work easily when detecting the presence or absence of an object to be measured or the concentration thereof using a plurality of quartz sensors equipped with a Langevin type quartz resonator. As a concrete means for solving the problem, a quartz sensorequipped with a quartz resonatorforming an adsorbing layer to adsorb a target component to be measured on one surface side and coming into contact with an airtight space on the other surface side is installed in a printed circuit boardvia a base. A plurality of quartz sensorsis detachably installed respectively in a plurality of connecting terminal units provided in a horizontal arrangement on a side surfaceof the measuring device main unitvia a connecting terminal unitformed on an end of the printed circuit boardin a state that the above-described adsorbing layer faces upward. The measuring device main unitincludes an oscillation circuitelectrically connected to the quartz sensor, detects the variation of the natural frequency of the quartz resonator due to coming the sample solution into contact with the above-described adsorbing layer, and measures at least one of the presence of the target component to be measured or the concentration of the target component in the sample solution based on the detection result.


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