The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2009
Filed:
Sep. 21, 2004
Mohsen S. Yeganeh, Piscataway, NJ (US);
Shawn M. Dougal, Livingston, NJ (US);
Cheayao Zhang, Annandale, NJ (US);
Saul C. Blum, Monroe, NJ (US);
H. Alan Wolf, Franklin Lakes, NJ (US);
Glen Barry Brons, Phillipsburg, NJ (US);
Mohsen S. Yeganeh, Piscataway, NJ (US);
Shawn M. Dougal, Livingston, NJ (US);
Cheayao Zhang, Annandale, NJ (US);
Saul C. Blum, Monroe, NJ (US);
H. Alan Wolf, Franklin Lakes, NJ (US);
Glen Barry Brons, Phillipsburg, NJ (US);
ExxonMobil Research & Engineering Company, Annandale, NJ (US);
Abstract
The corrosion rate of a metal immersed in a fluid medium is measured by transmission of a beam of radiation normally in the visible or near infra-red portion of the spectrum, through a thin film of the metal immersed in the medium. The film of the metal is suitably supported on a radiation-transmitting substrate such as a glass plate or slide. The corrosion rate can be determined by passing a radiation beam through the metal film sample using a twin beam system to compensate for instrument factors such as the absorbance by the fluid medium, the cell windows and the film-supporting substrate. As the thickness of the film decreases, the reduction in film thickness is determined by the increase in beam intensity, using a reference beam to compensate for the instrument factors.