The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2009

Filed:

Sep. 14, 2007
Applicants:

Paul W. Neagle, Westerville, OH (US);

Laura J. Silva, Dublin, OH (US);

Eric A. Daymo, Dublin, OH (US);

David J Kuhlmann, Powell, OH (US);

Marc Wagner, Saint-Maur-des-Fossés, CA;

Inventors:

Paul W. Neagle, Westerville, OH (US);

Laura J. Silva, Dublin, OH (US);

Eric A. Daymo, Dublin, OH (US);

David J Kuhlmann, Powell, OH (US);

Marc Wagner, Saint-Maur-des-Fossés, CA;

Assignee:

Velocys, Inc., Plain City, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L 19/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining the maximum allowable working pressure of a microchannel device, particularly a diffusion-bonded, shim-based microchannel device operating at a temperature greater to or equal to a base material threshold temperature where significant creep may predominate, and when employing non-traditional materials of construction, when non-traditional fabrication or joining methods are used, or when spurious artifacts arise.


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