The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Mar. 30, 2007
Applicant:

Robert Pochowski, Sunnyvale, CA (US);

Inventor:

Robert Pochowski, Sunnyvale, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G01R 13/00 (2006.01); G01M 19/00 (2006.01); G06F 7/38 (2006.01); H03K 19/173 (2006.01); H03K 19/00 (2006.01); H01L 25/00 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An Application Specific Distributed Test Engine (ASDTE) that provides an optimized set of test resources for a given application. The test engine resources, configuration, functionality, and even the number of test engines can be changed as different devices are tested, or as different test methodologies are used with the system. This can be done by including the test engine configuration as a part of the application files that are loaded during the system set-up. This approach differs from conventional testing systems which limit testing to a fixed, limited, or standard stimulus/response engine configuration intended to test a variety of devices. Some of the benefits of the Application Specific Distributed Test Engine Architecture include: (1) a very high test throughput, (2) the ability to adapt system functionality and capabilities to meet different and new, unforeseen device test requirements on a lot-by-lot basis on a production test floor, and (3) the ability to change the number of test engines to optimize tester channels and system utilization.


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