The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jun. 13, 2002
Yoshitaka Bito, Kawaguchi, JP;
Shigeo Sumino, Fuchu, JP;
Hajime Sasaki, Kawasaki, JP;
Hitoshi Matsuo, Musashino, JP;
Yoshiyuki Nakayama, Kawasaki, JP;
Yoshitaka Bito, Kawaguchi, JP;
Shigeo Sumino, Fuchu, JP;
Hajime Sasaki, Kawasaki, JP;
Hitoshi Matsuo, Musashino, JP;
Yoshiyuki Nakayama, Kawasaki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
There is provided a process analysis method capable of clustering of executed processes and extraction of similar processes. A process analysis method of the present invention converts the similarity between processes into a numeric value as a metric by including a process matrix transformand a metric calculationfor process recordsmade up of a series of records of rendered service of at least three elements of the time of service, the type of service, and the quantity of service. This enables the calculation of the similarity between processes as a metric from information of only a series of records of rendered services. Accordingly, it becomes possible to cluster the executed processes and to extract similar processes based on the metric herein calculated.