The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Feb. 12, 2007
Aaron D. Lazarus, Baltimore, MD (US);
Wayne C. Jones, Catonsville, MD (US);
Aaron D. Lazarus, Baltimore, MD (US);
Wayne C. Jones, Catonsville, MD (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
The present invention provides a baseline function, viz., a transmission-related parameter (transmission loss, transmission coefficient, etc.) as a function of resistance of a uniformly resistant finitely thin film—which is predicated on the theoretical behavior of electromagnetic radiation passing through a uniformly resistant infinitely thin film. This theoretical behavior is characterized by constancy of the transmission-related parameter for any frequency of the electromagnetic radiation, wherein each resistance value has associated therewith a constant transmission-related parameter. The baseline function is formed by calculating the constant transmission-related parameter value for each of plural resistance values in the theoretical model. The baseline function is correlated with an empirical function, viz., a transmission-related parameter as a function of frequency of the electromagnetic radiation—which is formed, in empirical testing, by measuring the transmission-related parameter value for each of plural resistance values. The correlation yields a functional relationship between resistance and frequency.