The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jun. 13, 2008
Richard L. Baer, Los Altos, CA (US);
John Stewart Wenstrand, Menlo Park, CA (US);
Richard L. Baer, Los Altos, CA (US);
John Stewart Wenstrand, Menlo Park, CA (US);
Aptina Imaging Corporation, Grand Cayman, KY;
Abstract
A method and apparatus for intelligent distributed analyses of images including capturing the images and analyzing the captured images, where feature information is extracted from the captured images. The extracted feature information is used in determining whether a predefined condition is met, and the extracted feature information is transmitted for further analysis when the predefined condition is met. The extracted feature information is stored and is used to generate statistical information related to the extracted feature information. Further, additional feature information is provided from other databases to implement further analysis including an event detection or recognition. Accordingly, distributed intelligent analyses of images is provided for analyzing captured images to efficiently and effectively implement event detection or recognition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile