The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Jun. 14, 2004
Applicants:

Steven P. Thomas, Westfield, IN (US);

Timothy D. Garner, Kokomo, IN (US);

Inventors:

Steven P. Thomas, Westfield, IN (US);

Timothy D. Garner, Kokomo, IN (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a method and a system for determining whether a target component of an electronic assembly is assembled correctly. The method of the present invention involves correlating the view of a test electronic assembly with both a positive control image and a negative control image. The positive control image is an image of an electronic assembly that has been assembled properly, whereas the negative control image is an image of an electronic assembly that has been assembled improperly. If the correlation between the test image and the positive control image is greater than the correlation between the test image and the negative control image, the test assembly is assembled properly. On the other hand, if the correlation between the test image and the negative control image is greater than the correlation between the test image and the positive control image, the test assembly is assembled improperly.


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