The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Oct. 23, 2006
Peter Rothschild, Boston, MA (US);
Jeffrey Schubert, Somerville, MA (US);
William J. Baukus, Nashua, NH (US);
William Wade Sapp, Jr., Melrose, MA (US);
Richard Schueller, Chelmsford, MA (US);
Joseph Callerame, Waltham, MA (US);
William Randall Cason, Tewksbury, MA (US);
Peter Rothschild, Boston, MA (US);
Jeffrey Schubert, Somerville, MA (US);
William J. Baukus, Nashua, NH (US);
William Wade Sapp, Jr., Melrose, MA (US);
Richard Schueller, Chelmsford, MA (US);
Joseph Callerame, Waltham, MA (US);
William Randall Cason, Tewksbury, MA (US);
American Science and Engineering, Inc., Billerica, MA (US);
Abstract
Systems and methods for inspecting an object with a scanned beam of penetrating radiation are disclosed. Scattered radiation from the beam is detected, in either the backward or forward direction. Characteristic values of the backscattered radiation are compared to expected reference values to characterize the object. Additionally, penetrating radiation transmitted through the inspected object may be combined with scatter information. In certain embodiments, the inspected field of view is less than 0.1 steradians, and the detector is separate from the source of penetrating radiation and is disposed, with respect to the object, such as to subtend greater than 0.5 steradians in the field of view of the object.