The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Sep. 15, 2003
Samuel H. Reichgott, Coopersburg, PA (US);
Raul A. Casas, Doylestown, PA (US);
Samir N. Hulyalkar, Newtown, PA (US);
Azzedine Touzni, Doylestown, PA (US);
John J. Zygmaniak, Columbus, NJ (US);
Andrew E. Youtz, Rocky Hill, NJ (US);
Samuel H. Reichgott, Coopersburg, PA (US);
Raul A. Casas, Doylestown, PA (US);
Samir N. Hulyalkar, Newtown, PA (US);
Azzedine Touzni, Doylestown, PA (US);
John J. Zygmaniak, Columbus, NJ (US);
Andrew E. Youtz, Rocky Hill, NJ (US);
ATI Technologies, Inc., Ontario, CA;
Abstract
A method for selecting an antenna direction setting for optimum signal reception prior to channel equalization provides a set of metrics, referred to as channel quality metrics (CQM), that characterize the quality of the received signal for a given antenna setting and a generic algorithm that uses these metrics to select the antenna setting for an optimum reception. This invention utilizes five main CQMs: a Signal Strength Metric (SSM), a minimum mean squared error of a decision feedback equalizer (MMSE (DFE)) channel quality metric, a MMSE for a linear equalizer (MMSE(LE)) channel quality metric, a Spectral Flatness Metric (SFM) and an interference degradation metric (IDM).