The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jul. 25, 2005
Applicants:
Yoshinori Iketaki, Oume, JP;
Takeshi Watanabe, Tama, JP;
Masaaki Fujii, Yokohama, JP;
Inventors:
Assignees:
Olympus Corporation, Tokyo, JP;
Tokyo Institute of Technology, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A super-resolution microscope includes an optical system for combining a part of a first coherent light from a first light source and a part of a second coherent light from a second light source and focusing the coherent lights onto a sample, scanning , unit for scanning the coherent lights, and a detecting unit for detecting an optical response signal from the sample. The microscope is configured so as to satisfy the following conditions:σIpτ≦1, and0.65(λ)≦τσ