The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Feb. 28, 2007
Applicants:

Douglas P Wornson, Northfield, MN (US);

Mark M Wornson, Dundas, MN (US);

Eric L Hegstrom, Tucson, AZ (US);

Inventors:

Douglas P Wornson, Northfield, MN (US);

Mark M Wornson, Dundas, MN (US);

Eric L Hegstrom, Tucson, AZ (US);

Assignee:

Lite Sentry Corporation, Dundas, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A glass defect detection system comprising an apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a large sheets of glass is disclosed. The defect detection system utilizes a plurality of dark-field illumination systems and bright-field illumination systems and a plurality of baffles. A plurality of imaging devices are deployed to obtain images of transparent sheets. The defect detection system provides uniform lighting capable of equal detection of defects in all orientations and geometries. An image processing system analyzes for defects in and on the transparent sheet.


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