The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jun. 20, 2007
Takafumi Nakamura, Kyoto, JP;
Takafumi Nakamura, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Provided is a differential refractive index detector having a light receiving element, a zero glass, a zero glass driving unit and a storing portion, and is capable of performing purging operation thoroughly based on a unified standard. The light receiving element receives a measuring light passing through cells (S, R) to generate a slit image. The zero glass makes the slit image parallelly move on the light receiving element. The zero glass driving unit makes the zero glass rotate. The storing portion stores a rotating angle of the zero glass when the same solution fills up the two cells (S, R). When a purging operation for replacing a reference solution in the flow cell is performed, the stored rotating angle is taken as a standard value for being compared with a current rotating angle of the zero glass. If the two angles are the same, the purging operation is finished.