The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Sep. 11, 2007
Applicants:

Osamu Nagashima, Mobara, JP;

Kurando Shinba, Mobara, JP;

Eisuke Hatakeyama, Mobara, JP;

Hikaru Ito, Mobara, JP;

Masataka Natori, Chiba, JP;

Inventors:

Osamu Nagashima, Mobara, JP;

Kurando Shinba, Mobara, JP;

Eisuke Hatakeyama, Mobara, JP;

Hikaru Ito, Mobara, JP;

Masataka Natori, Chiba, JP;

Assignee:

Hitachi Displays, Ltd., Chiba-ken, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
Abstract

A liquid crystal display device is provided to prevent gas bubbles from being generated due to the contact of an inspection probe. An insulating film composed of a gate insulating film and a protection film is formed on a gate wire and wire inspection terminal, and is partially removed from an upper surface of the wire inspection terminal to form a concave portion exposing the top surface of the wire inspection terminal. A transparent conductive film made of ITO is formed on the insulating film, including the concave portion on the wire inspection terminal. The transparent conductive film is electrically connected with the wire inspection terminal at the concave portion, and formed extending onto the gate insulating film and protection film on the opposite side of a scanning wire of the wire inspection terminal. Disconnection inspection is performed using the extending portion as a contact portion with an inspection probe.


Find Patent Forward Citations

Loading…