The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Jul. 18, 2005
Applicants:
Pertti Hakonen, Helsinki, FI;
Mika Sillanpaa, Espoo, FI;
Leif Roschier, Vantaa, FI;
Inventors:
Assignee:
MagiQ Technologies, Inc., New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/00 (2006.01); H01L 29/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention is a sensitive measuring instrument, which is principally applied to quantum computation, especially to measurement of quantum bits consisting of superconducting micro and nano-structures. The state of a quantum bit is expressed as the voltage-time integral over a circuit component. Phase measurement is performed by measuring the capacitance of a single-electron transistor between the gate and ground.