The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Jun. 20, 2008
Applicant:

Daniel R. Marshall, Boise, ID (US);

Inventor:

Daniel R. Marshall, Boise, ID (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/40 (2006.01); G02B 7/04 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A focus sensing system adaptable for use in microscopes or other optical systems incorporates a selective beam block. An outgoing reference beam, incident upon a target to be inspected, is reflected to become an incoming reference beam. A beam block inserted within the optical system selectively rejects unwanted reflections from surfaces other than the target allowing the desired incoming reference beam to be photodetected without interference from reflections off of surfaces that are not of interest. The photodetector generates an electronic signal corresponding to the displacement of the target from the ideal focal point. The electrical signal may be used to drive a servomechanism to displace either the target or the microscope objective lens to bring the target into focus.


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