The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 2009

Filed:

Jan. 29, 2007
Applicants:

Emad Soubh, Camas, WA (US);

Doug Mccartin, Henryville, IN (US);

Jeremy Wooldridge, Shepherdsville, KY (US);

Steve Koopman, Floyds Knobs, IN (US);

Inventors:

Emad Soubh, Camas, WA (US);

Doug McCartin, Henryville, IN (US);

Jeremy Wooldridge, Shepherdsville, KY (US);

Steve Koopman, Floyds Knobs, IN (US);

Assignee:

Samtec, Inc., New Albany, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01R 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe is provided for testing the electrical characteristics of a device. The probe includes a housing, a plurality of cables, a circuit board located within the housing, and a field-replaceable probe tip. The probe tip includes an array of contacts. Each of the plurality of cables is connected to a corresponding contact. The probe includes a retractable shroud that retracts as the probe is connected to the device. The contacts have bifurcated tips.


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