The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 23, 2009
Filed:
Mar. 21, 2007
Hisashi Tsukada, Tokyo, JP;
Hiroaki Okada, Tokyo, JP;
Yutaka Nishio, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Hisashi Tsukada, Tokyo, JP;
Hiroaki Okada, Tokyo, JP;
Yutaka Nishio, Tokyo, JP;
Yasufumi Fukuma, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A fundus observation device is provided capable of capturing both images of the surface of the fundus oculi and tomographic images of the fundus oculi, and capable of preventing alignment indicators from being reflected in the image of the fundus oculi. Image forming partoperates to form surface images based on results of detecting the reflection light by the fundus oculi Ef of the illumination light obtained from a fundus camera unitA, and operates to form tomographic images based on results of detecting interference light LC by the OCT unit. The fundus camera unit comprises alignment optical systemsA andA, which project an alignment indicator. Detection timing controlling partB controls a fundus camera unit 1A and makes it detect the illumination light substantially simultaneously with detection of the interference light. Before the interference light LC and illumination light are substantially simultaneously detected, the alignment controlling partcontrols the alignment optical systemA andA and terminates the projection of the alignment light indicator. Correction processing partcorrects the image position of tomographic images using the surface images obtained substantially simultaneously.