The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2009

Filed:

Jan. 13, 2006
Applicants:

Masahito Tanaka, Okayama, JP;

Ikuo Nanno, Okayama, JP;

Akira Takaishi, Okayama, JP;

Inventors:

Masahito Tanaka, Okayama, JP;

Ikuo Nanno, Okayama, JP;

Akira Takaishi, Okayama, JP;

Assignee:

Omron Corporation, Kyoto-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); C03B 9/41 (2006.01); G05B 21/00 (2006.01); G05D 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A temperature variation of a glass substrateat a plurality of measuring points in a continuous furnacewhen preset temperatures of respective furnaces-are changed is estimated in the form of a matrix based on a model, an inverse matrix of the matrix is used so as to calculate correction values in such manner that a temperature of the glass substratecorresponds to a temperature of a desired temperature profile, and the preset temperatures are corrected based on the correction values.


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