The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2009

Filed:

Nov. 08, 2005
Applicants:

Jérôme Laine, Sautron, FR;

Jean-paul Menard, Pornic, FR;

Inventors:

Jérôme Laine, Sautron, FR;

Jean-Paul Menard, Pornic, FR;

Assignee:

Sercel, Carquefou, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an apparatus and a method for data acquisition, the apparatus being characterized in that it comprises an analog/digital converter () sampling at an imperfect frequency Fprovided by a local clock () data acquired by a sensor () thus providing a series of sampled and dated data E[k], a time-stamping module () for measuring the frequency error of the local clock () by determining the sampling dates according to a universal time UTC(t), and a resampling module () for correcting the sampled and dated data E[k].


Find Patent Forward Citations

Laine, Jérôme. (2009). Apparatus and method for compensating the drift of a local clock used as sampling frequency (U.S. Patent No. 7548600). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7548600

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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