The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2009

Filed:

Oct. 28, 2005
Applicants:

Yee Seung NG, Fairport, NY (US);

Hwai-tzuu Tai, Rochester, NY (US);

Chung-hui Kuo, Fairport, NY (US);

Dmitri Anatolyevich Gusev, Fairport, NY (US);

Inventors:

Yee Seung Ng, Fairport, NY (US);

Hwai-Tzuu Tai, Rochester, NY (US);

Chung-Hui Kuo, Fairport, NY (US);

Dmitri Anatolyevich Gusev, Fairport, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01); G06K 15/00 (2006.01); H04N 1/40 (2006.01); G03F 3/08 (2006.01); G06K 9/00 (2006.01); B41J 2/385 (2006.01); B41J 2/325 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for calibrating a multi-color imaging system are provided. Color values are measured for each of the different color patches, and compared to target process-sensitive colors color values, representing a weight-adjusted memory color. An error value is calculated. The error value represents a deviation of the measured color values from the target color values. The input values for each colorant then are independently adjusted to reduce the error value to a predetermined degree.


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