The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2009
Filed:
May. 05, 2006
Peter Allen Sieck, Santa Rosa, CA (US);
Joe Earle Guthrie, Sonoma, CA (US);
Peter Alan Maschwitz, Sebastopol, CA (US);
Clive Hilton Burton, Novato, CA (US);
Vanhlacky Lucky Singhavara, Rohnert Park, CA (US);
Bryan Richard Marshall, Rohnert Park, CA (US);
Peter Allen Sieck, Santa Rosa, CA (US);
Joe Earle Guthrie, Sonoma, CA (US);
Peter Alan Maschwitz, Sebastopol, CA (US);
Clive Hilton Burton, Novato, CA (US);
Vanhlacky Lucky Singhavara, Rohnert Park, CA (US);
Bryan Richard Marshall, Rohnert Park, CA (US);
AGC Flat Glass North America, Inc., Kingsport, TN (US);
Abstract
An apparatus for measuring the reflectance properties of an object having a front reflecting surface and at least one back reflecting surface. The apparatus includes a sample stage for placement of the object, a light source, a detector configured to detect reflected light from the object, and a positioning device configured to provide a plurality of angular positions for the light source and the detector relative to the object on the sample stage such that incident light on the object is specularly reflected towards the detector and the reflected light received at the detector includes a front surface reflection from the object and at least one back surface reflection from the object. The method includes illuminating the object at varying angles of incidence, collecting reflected light from the front and back reflecting surfaces of the object at respective specularly reflected angles, wavelength resolving the reflected light into a color spectrum, and analyzing an intensity of the color spectrum as a function of wavelength.